by ASEVA | Nov 16, 2016 | Conference

The 33rd European Conference on Surface Science (ECOSS-33) will be organized in Hungary, Szeged (27 Aug-1 Sep. 2017). ECOSS is a traditional annual meeting directed jointly by the Surface Science Division of the International Union for Vacuum Science, Technique and Applications (IUVSTA) and the Surface and Interface Section of the European Physical Society (EPS).
by ASEVA | Nov 14, 2016 | Conference

CSIR-National Physical Laboratory (NPL) is organizing the International Conference on Thin Films (ICTF-17) in collaboration of Indian Vacuum Society during 13-17 November 2017 at NPL, New Delhi.
by ASEVA | Nov 4, 2016 | Uncategorized
Best IUVSTA image contest!
During IVC20 in Korea a collaborative project to modernize the IUVSTA web-site was launched. The best entries will be awarded during next ECM in Slovenia.
Please send the images before December 15, 2016 to anouk.galtayries@sfr.fr or via Dropbox.
This is a call for collecting your best images depicting experiments, techniques, samples, spectrometers, UHV/vacuum devices, working scientists, innovative applications etc. related to the IUVSTA scientific and technical domains. The goal is to make the web-site an effective tool for communication and to enhance the visibility of the Union and Member Societies’ activities.
Please send us illustrations that you have in your national societies, research laboratories, companies to be used in our upgraded web site.
Note that the images have to be copy-right-free; full credits to the authors will be given. Please, provide a brief caption describing the image.
Nice colors, nice shapes, nice photographic effects are very welcome! (more…)
by ASEVA | Oct 28, 2016 | Conference

The 6th CCM International Conference on Pressure and Vacuum Metrology in conjunction with the 5th International Conference IMEKO TC16 will take place from May 8-10, 2017 in Pereira, Colombia.
The CCM International Conference on Pressure and Vacuum Metrology is the world’s leading conference on measurement related issues in the pressure and vacuum field. It is to review research and developing work on highest quality primary standards and the dissemination of traceability to the most exacting and demanding users in the range from 10 ^-9 Pa to 10 ^10 Pa.
The International Conference IMEKO TC16 on pressure measurement focuses on the more practical aspects of pressure and vacuum measurement mainly for industrial sectors like process and semiconductor industry, photovoltaic, coating, metallurgy, packaging, pharmaceutical and others but also for research applications.
http://inm.gov.co/ccmpv6/index.php?option=com_content&view=article&id=35&Itemid=261&lang=en
by ASEVA | Sep 14, 2016 | Workshop
79th IUVSTA Workshop: 3D Chemical Imaging – from fundamentals to advancing applications
This workshop will engage leading scientists in the area of 3D chemical imaging in a lively scientific debate to address fundamentals and important challenges for 3D secondary ion mass spectrometry (SIMS), FIB-SIMS and atom probe tomography.
15 – 19 May 2017, Hotel Flamingo Resort, Pula, Sardinia, Italy
by ASEVA | Sep 13, 2016 | Uncategorized
80th IUVSTA Workshop: Ultra Low emittance light source vacuum systems
The goal of this workshop is to find the best solutions on the vacuum design and the manufacturing processes for those upgrade projects, ongoing or being planned, of synchrotron light source facilities to achieve the ultra-low emittance of < 0.5 nm·rad. There are many challenging issues on vacuum design and engineering under debate and need to be well evaluated by the vacuum experts from the worldwide institutes or facilities. This workshop provides a forum for intensive discussions after each presentation.
24-28 October 2016, NSRRC, Hsinchu, Taiwan
http://www.taiwanvacuum.org/index.php/en/ws80
by ASEVA | Jul 20, 2016 | Graphical Abstract Group
Description:
The aim of our research group is to study systems at the nanometer scale (1nm=10-9 m). In particular we study molecules and biomolecules, small particles, atomic layers with thickness in the nanometer range and atomically clean surface…
by ASEVA | Jan 30, 2015 | Articles, Highlights
Author: Roman A.Nevshupa, et al.
Tribology International, 2018
Abstract:
The main difficulty in designing of an ultrahigh vacuum (UHV) tribometer combined with tribophysical and tribochemical characterization techniques is to find the critical compromise between the scientific requirements and technical…