The eighth international conference on Innovations in Thin Film Processing and Characterization (ITFPC’17) will be held in Nancy (France) on October 23-27, 2017. This biennial conference is organized by the Société Française du Vide (SFV) and the Institut Jean Lamour (IJL).
Besides the scientific topics covered by the conference, this event aims at providing an open forum to discuss on progresses and latest developments in thin film processing (etching, CVD and PVD) and engineering including nano-layer growth and
properties, surface functionalization, covering a wide field of applications in energy, nanotechnology, mechanics, optics, photonics, chemistry, biology, medicine, etc. The characterization methods will be emphasized with particular focus on the new trends in atomic scale investigation.
The ITFPC 17 rises as the high-technology meeting playing, as in the previous editions, the catalyst role for efficient exchanges between the academic and industrial fields contributing thus to technological transfers.
The conference will include invited plenary talks, keynote lectures, selected oral presentations and poster sessions.